DocumentCode
3251867
Title
Analysis of vacuum microelectronic components by the use of special finite elements
Author
Kopka, P. ; Ermert, H.
Author_Institution
Dept. of Electr. Eng., Ruhr-Univ., Bochum, Germany
fYear
1995
fDate
July 30 1995-Aug. 3 1995
Firstpage
247
Lastpage
251
Abstract
For vacuum microelectronic devices special finite elements have been introduced which are able to describe field enhancements near cone emitters with small radius of emitter curvature in an effective way. Compared to conventional methods, simulations using these elements can be carried out more precisely and with less computer time and storage.
Keywords
finite element analysis; vacuum microelectronics; cone emitters; electric field enhancement; finite element simulation; vacuum microelectronic devices; Anodes; Computational modeling; Computer simulation; Diodes; Electron emission; Electron tubes; Electrostatic analysis; Finite element methods; Laplace equations; Microelectronics;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location
Portland, OR, USA
Print_ISBN
0-7803-2143-X
Type
conf
DOI
10.1109/IVMC.1995.487037
Filename
487037
Link To Document