• DocumentCode
    3251993
  • Title

    Computer simulation of field emission for multilayer cathodes

  • Author

    Litovchenko, V.G. ; Kryuchenko, Yu.V.

  • Author_Institution
    Inst. of Semicond. Phys., Acad. of Sci., Kiev, Ukraine
  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    271
  • Abstract
    Summary form only given. High efficiency of field emission can be achieved using an effect of electron spectrum quantization in a thin metal film coated emitter surface. Another way to realize this mechanism is the development of systems with built-in quantum wells, in particular, delta-doped layers. Here we have considered the case of multilayer quantum size structures with the number of quantum wells N more than 1. It turned out that in this case current-field characteristics have many important peculiarities due to the additional effect of electron resonant tunneling through the structure. The influence of quantum well and barrier parameters on emission currents is analyzed for different N. The conditions for efficient field emission at low applied voltages are found. Computer calculations are made for a multilayer Si-SiO/sub 2/ structure with the thicknesses of quantum wells and barriers d=3-5 nm. Results of calculations are compared with experiment.
  • Keywords
    cathodes; electron field emission; semiconductor quantum wells; tunnelling; Si-SiO/sub 2/; computer simulation; current-field characteristics; delta-doped layers; electron resonant tunneling; electron spectrum quantization; field emission; multilayer cathode; quantum size structure; quantum wells; Cathodes; Coatings; Computer simulation; Electron emission; Nonhomogeneous media; Physics; Quantization; Quantum computing; Resonant tunneling devices; Semiconductor films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.487046
  • Filename
    487046