مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3252178

Title :

SOI Materials and Characterization

fYear :

2006

fDate :

Oct. 2006

Firstpage :

Lastpage :

Keywords :

Bonding; Laboratories; Microwave devices; Microwave photonics; Microwave technology; Optical materials; Performance analysis; Research and development; Silicon; Substrates;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

International SOI Conference, 2006 IEEE

Conference_Location :

Niagara Falls, NY, USA

ISSN :

1078-621X

Print_ISBN :

1-4244-0290-5

Electronic_ISBN :

1078-621X

Type :

conf

DOI :

10.1109/SOI.2006.284416

Filename :

4062864

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3252178