Title :
Defect Analysis of Electric and Photonic Double Layer Substrate made by SIMOX 3D sculpting
Author :
Kishima, Koichiro
Author_Institution :
Mater. Labs., Sony Corp., Tokyo
Abstract :
From the viewpoint of electric device fabrication, we examined a SIMOX 3D sculpting method (Koonath, 2003) that three dimensionally integrate electric circuits and photonic circuits on an SOI substrate. We investigated buried optical waveguide structure underneath the silicon surface and defect characteristics on the surface of the substrate made by 8" size SIMOX 3D sculpting. As a result, we showed that balancing between no defects on the silicon surface and a formation of buried waveguide is achievable when the BOX by SIMOX 3D sculpting is continuous
Keywords :
SIMOX; buried layers; integrated circuit testing; integrated optics; optical waveguides; semiconductor technology; substrates; 8 in; SIMOX 3D sculpting method; SOI substrate; buried oxide; buried waveguide; double layer defect analysis; electric double layer; electric-photonic circuit integration; photonic substrate double layer; Annealing; Circuits; Ion implantation; Optical surface waves; Optical waveguides; Oxygen; Particle beam optics; Silicon; Surface waves; Temperature;
Conference_Titel :
International SOI Conference, 2006 IEEE
Conference_Location :
Niagara Falls, NY
Print_ISBN :
1-4244-0289-1
Electronic_ISBN :
1078-621X
DOI :
10.1109/SOI.2006.284419