DocumentCode
3252331
Title
Posters
fYear
2006
fDate
2-5 Oct. 2006
Firstpage
42
Lastpage
43
Abstract
Start of the above-titled section of the conference proceedings record.
Keywords
CMOS technology; Circuits; Information technology; Laboratories; MOSFETs; Materials science and technology; Microelectronics; Strain measurement; Substrates; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
International SOI Conference, 2006 IEEE
Conference_Location
Niagara Falls, NY
ISSN
1078-621X
Print_ISBN
1-4244-0289-1
Type
conf
DOI
10.1109/SOI.2006.284424
Filename
4062872
Link To Document