• DocumentCode
    3252527
  • Title

    Assessment of ANN-based auto-reclosing scheme developed on single machine-infinite bus model with IEEE 14-bus system model data

  • Author

    Fitiwi, Desta Zahlay ; Rao, K. S Rama

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. Teknol. PETRONAS, Tronoh, Malaysia
  • fYear
    2009
  • fDate
    23-26 Jan. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper focuses on methods to discriminate a temporary fault from a permanent one, and accurately determine fault extinction time in an extra high voltage (EHV) transmission line in a bid to develop a self-adaptive automatic reclosing scheme. Consequently, improper reclosing of the line onto a fault is avoided. The fault identification prior to reclosing is based on optimized artificial neural network associated with three different training algorithms. In addition, Taguchi´s methodology is employed in optimizing parameters that significantly influence during and post-training performance of the neural network. A comparison of overall performance of the three algorithms, developed and coded in MATLABTM software environment, is also presented. To validate the work, the developed technique in a single machine infinite bus (SMIB) model has been tested by data obtained from benchmark IEEE 14-bus system model simulations. The results show the efficacy of the developed adaptive automatic reclosing method.
  • Keywords
    Taguchi methods; learning (artificial intelligence); neural nets; power engineering computing; power transmission faults; power transmission lines; ANN-based auto-reclosing scheme assessment; IEEE 14-bus system model data; MATLAB software environment; Taguchi methodology; extra high voltage transmission line; fault identification; optimized artificial neural network; self-adaptive automatic reclosing scheme; single machine-infinite bus model; Artificial neural networks; Fault diagnosis; MATLAB; Mathematical model; Optimization methods; Software algorithms; Software performance; System testing; Transmission lines; Voltage; Autoreclosure; Levenberg Marquardt; Neural Network; Resilient Back-propagation; Taguchi´s method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2009 - 2009 IEEE Region 10 Conference
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-4546-2
  • Electronic_ISBN
    978-1-4244-4547-9
  • Type

    conf

  • DOI
    10.1109/TENCON.2009.5395874
  • Filename
    5395874