DocumentCode :
3252527
Title :
Assessment of ANN-based auto-reclosing scheme developed on single machine-infinite bus model with IEEE 14-bus system model data
Author :
Fitiwi, Desta Zahlay ; Rao, K. S Rama
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Teknol. PETRONAS, Tronoh, Malaysia
fYear :
2009
fDate :
23-26 Jan. 2009
Firstpage :
1
Lastpage :
6
Abstract :
This paper focuses on methods to discriminate a temporary fault from a permanent one, and accurately determine fault extinction time in an extra high voltage (EHV) transmission line in a bid to develop a self-adaptive automatic reclosing scheme. Consequently, improper reclosing of the line onto a fault is avoided. The fault identification prior to reclosing is based on optimized artificial neural network associated with three different training algorithms. In addition, Taguchi´s methodology is employed in optimizing parameters that significantly influence during and post-training performance of the neural network. A comparison of overall performance of the three algorithms, developed and coded in MATLABTM software environment, is also presented. To validate the work, the developed technique in a single machine infinite bus (SMIB) model has been tested by data obtained from benchmark IEEE 14-bus system model simulations. The results show the efficacy of the developed adaptive automatic reclosing method.
Keywords :
Taguchi methods; learning (artificial intelligence); neural nets; power engineering computing; power transmission faults; power transmission lines; ANN-based auto-reclosing scheme assessment; IEEE 14-bus system model data; MATLAB software environment; Taguchi methodology; extra high voltage transmission line; fault identification; optimized artificial neural network; self-adaptive automatic reclosing scheme; single machine-infinite bus model; Artificial neural networks; Fault diagnosis; MATLAB; Mathematical model; Optimization methods; Software algorithms; Software performance; System testing; Transmission lines; Voltage; Autoreclosure; Levenberg Marquardt; Neural Network; Resilient Back-propagation; Taguchi´s method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2009 - 2009 IEEE Region 10 Conference
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-4546-2
Electronic_ISBN :
978-1-4244-4547-9
Type :
conf
DOI :
10.1109/TENCON.2009.5395874
Filename :
5395874
Link To Document :
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