Title :
In-Plane Deformation Measurement by Subtraction Computer-Aided Speckle Interferometry
Author :
Fan, Jinping ; Zhang, Yonglin ; Lv, Xiaoxu
Author_Institution :
Inst. of Optoelectron. Eng., Jinan Univ., Guangzhou, China
Abstract :
Contra pose the custom addition mode computer-aided speckle interferometry, which has a poor signal-noise-radio and bad anti-noise capacity, we propose a subtraction computer-aided speckle interferometry. By analyzing the intensity addition, subtraction mode computer-aided speckle interferometry and amplitude addition, subtraction mode computer-aided speckle interferometry, then find that the amplitude subtraction computer-aided speckle interferometry has the best anti-noise capacity, highest signal-noise-radio and highest measured accuracy. So the amplitude subtraction computer-aided speckle interferometry is the best method to measure the deformation of specimen.
Keywords :
Fourier transform optics; deformation; light interferometry; measurement by laser beam; mechanical variables measurement; optical engineering computing; speckle; Fourier transform; amplitude subtraction; anti-noise capacity; in-plane deformation measurement; intensity addition; laser-speckle method; subtraction computer-aided speckle interferometry; Charge coupled devices; Charge-coupled image sensors; Fast Fourier transforms; Fourier transforms; Hydrogen; Optical noise; Radio interferometry; Rotation measurement; Signal analysis; Speckle;
Conference_Titel :
Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4412-0
DOI :
10.1109/SOPO.2009.5230187