DocumentCode :
3252661
Title :
Field emission from GaAs pyramids fabricated using selected area vapor phase epitaxy
Author :
Shaw, J.L. ; Sillmon, R.S. ; Gray, H.F. ; Park, D.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
fYear :
1995
fDate :
July 30 1995-Aug. 3 1995
Firstpage :
408
Lastpage :
412
Abstract :
We report the fabrication of GaAs pyramids using selected area organometallic vapor phase epitaxy (SA-OMVPE) and field emission characteristics obtained from these structures. The use of crystal planes to define structure surfaces offers an attractive way of fabricating atomically sharp tip apexes in field emitter arrays (FEAs). For example, diamond crystals typically form such sharp apex structures. To use crystal structures as field emitters in a FEA, the orientation and size of the crystal surfaces must be controllable and consistent over the array, and the crystal should have electronic properties compatible with field emission. When high transconductance or high emission currents are required, these electronic properties should include a low resistance electron injecting contact, high bulk conductivity, and a modest surface potential barrier for electron field emission. In addition, formation of the tip structure must be compatible with formation of an adequate gate aperture. III-V semiconductor crystals grown by SA-OMVPE may provide a material and fabrication system capable of satisfying all these requirements.
Keywords :
III-V semiconductors; electron field emission; gallium arsenide; semiconductor epitaxial layers; semiconductor growth; vacuum microelectronics; vapour phase epitaxial growth; FEAs; GaAs; atomically sharp tip apexes; bulk conductivity; electron injecting contact; electronic properties; emission currents; field emission characteristics; field emitter arrays; gate aperture; organometallic vapor phase epitaxy; selected area vapor phase epitaxy; structure surfaces; surface potential barrier; transconductance; Atomic layer deposition; Crystals; Electron emission; Epitaxial growth; Fabrication; Field emitter arrays; Gallium arsenide; III-V semiconductor materials; Size control; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-2143-X
Type :
conf
DOI :
10.1109/IVMC.1995.487077
Filename :
487077
Link To Document :
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