DocumentCode
3252691
Title
Quantum corrected Ensemble Monte Carlo simulation of UTB-DGSOI. Contribution of Volume Inversion and Inter-Subband Modulation effects
Author
Sampedro, C. ; Gamiz, Francisco ; Godoy, A. ; Ruiz, F.G.
Author_Institution
Departamento de Electronica, Univ. de Granada
fYear
2006
fDate
2-5 Oct. 2006
Firstpage
79
Lastpage
80
Abstract
This work develops a method to include quantum corrections in ensemble Monte Carlo (EMC) simulations of ultrathin double gate SOI devices (UTB-DGSOI). The approach improves the effective conduction band edge (ECBE) method, by taking into account the effects of an arbitrary effective mass tensor describing valleys characteristics and confinement directions. This avoids the use of the effective mass as a fitting parameter, and allows the study of DGSOI channels with different surface orientations. This multivalley ECBE (MV-ECBE) method is applied to the study of UTB-DGSOI devices showing the important contribution of volume inversion (VI) and intersubband modulation effects on the drain current as the silicon thickness (TSi) decreases
Keywords
Monte Carlo methods; electromagnetic compatibility; quantum well devices; silicon-on-insulator; Monte Carlo simulation; drain current; effective conduction band edge; intersubband modulation effects; quantum corrections; ultrathin double gate SOI devices; volume inversion; Acoustic scattering; Effective mass; Electromagnetic compatibility; Electrons; Electrostatics; Particle scattering; Poisson equations; Silicon; Surface fitting; Tensile stress;
fLanguage
English
Publisher
ieee
Conference_Titel
International SOI Conference, 2006 IEEE
Conference_Location
Niagara Falls, NY
ISSN
1078-621X
Print_ISBN
1-4244-0289-1
Electronic_ISBN
1078-621X
Type
conf
DOI
10.1109/SOI.2006.284442
Filename
4062890
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