• DocumentCode
    3252691
  • Title

    Quantum corrected Ensemble Monte Carlo simulation of UTB-DGSOI. Contribution of Volume Inversion and Inter-Subband Modulation effects

  • Author

    Sampedro, C. ; Gamiz, Francisco ; Godoy, A. ; Ruiz, F.G.

  • Author_Institution
    Departamento de Electronica, Univ. de Granada
  • fYear
    2006
  • fDate
    2-5 Oct. 2006
  • Firstpage
    79
  • Lastpage
    80
  • Abstract
    This work develops a method to include quantum corrections in ensemble Monte Carlo (EMC) simulations of ultrathin double gate SOI devices (UTB-DGSOI). The approach improves the effective conduction band edge (ECBE) method, by taking into account the effects of an arbitrary effective mass tensor describing valleys characteristics and confinement directions. This avoids the use of the effective mass as a fitting parameter, and allows the study of DGSOI channels with different surface orientations. This multivalley ECBE (MV-ECBE) method is applied to the study of UTB-DGSOI devices showing the important contribution of volume inversion (VI) and intersubband modulation effects on the drain current as the silicon thickness (TSi) decreases
  • Keywords
    Monte Carlo methods; electromagnetic compatibility; quantum well devices; silicon-on-insulator; Monte Carlo simulation; drain current; effective conduction band edge; intersubband modulation effects; quantum corrections; ultrathin double gate SOI devices; volume inversion; Acoustic scattering; Effective mass; Electromagnetic compatibility; Electrons; Electrostatics; Particle scattering; Poisson equations; Silicon; Surface fitting; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International SOI Conference, 2006 IEEE
  • Conference_Location
    Niagara Falls, NY
  • ISSN
    1078-621X
  • Print_ISBN
    1-4244-0289-1
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2006.284442
  • Filename
    4062890