Title :
Statistical reach feature method and its application to robust image registration
Author :
Ozaki, Ryushi ; Satoh, Yutaka ; Iwata, Kenji ; Sakaue, Katsuhiko
Author_Institution :
Grad. Sch. of Syst. & Inf. Eng., Univ. of Tsukuba, Tsukuba, Japan
Abstract :
In this paper, a novel method for image registration method which affords robust results for various disturbances in the real world, including local and/or global variations of illumination, occlusions, and noises, is proposed. The registration process is based on a set of selected point-pairs with binary coded signs of differences, which is constructed from the given template image. The selection of the point-pairs is defined on the basis of statistical view point. The authors developed the mathematical model of the inverting-ratio which is the quantity strongly related to the similarity index, for the Gaussian-disturbances. The authors also verified the model by numerical experiments. The mathematical model, enforced by the numerical results, gives the theoretical backbone for the robustness of the proposed method.
Keywords :
Gaussian processes; image registration; statistical analysis; Gaussian-disturbances; image registration; inverting-ratio; point-pairs selection; similarity index; statistical reach feature method; Feature extraction; Gaussian noise; Gaussian processes; Image registration; Lighting; Mathematical model; Noise robustness; Numerical models; Pixel; Systems engineering and theory;
Conference_Titel :
TENCON 2009 - 2009 IEEE Region 10 Conference
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-4546-2
Electronic_ISBN :
978-1-4244-4547-9
DOI :
10.1109/TENCON.2009.5395884