Title :
Device Physics and Modeling
Keywords :
Analytical models; CMOS technology; Electronic components; FinFETs; History; Industrial electronics; MOSFETs; Physics; Research and development; TV;
Conference_Titel :
International SOI Conference, 2006 IEEE
Conference_Location :
Niagara Falls, NY, USA
Print_ISBN :
1-4244-0290-5
Electronic_ISBN :
1078-621X
DOI :
10.1109/SOI.2006.284447
