Title :
A Reliability Study of RFID Technology in a Fading Channel
Author :
Su, Weilian ; Beilke, Kyle M. ; Ha, Tri T.
Author_Institution :
Naval Postgrad. Sch., Monterey
Abstract :
RFID systems are an important component in the effort to increase the efficiencies of the logistics supply chain for the U.S. Department of Defense. While the U.S. DoD has mandated the use of RFID tags for its suppliers, the technology has not always kept up with the performance expectations. This study explores new modulation and coding techniques to possibly be used in the improvement of the read reliability of RFID systems. Bit and tag error probabilities are computed for OOK modulation scheme in a varying Nakagami-m fading channel.
Keywords :
fading channels; modulation coding; radiofrequency identification; RFID Technology; coding techniques; fading channel; logistics supply chain; modulation techniques; reliability study; Batteries; Costs; Equations; Fading; Logistics; Modulation coding; RFID tags; Radio transmitters; Radiofrequency identification; Supply chains;
Conference_Titel :
Signals, Systems and Computers, 2007. ACSSC 2007. Conference Record of the Forty-First Asilomar Conference on
Conference_Location :
Pacific Grove, CA
Print_ISBN :
978-1-4244-2109-1
Electronic_ISBN :
1058-6393
DOI :
10.1109/ACSSC.2007.4487614
