Title :
Electromigration instability of cylindrical surface microrelief
Author :
Fedirko, V.A. ; Eremchenko, D.V.
Author_Institution :
State Univ. of Technol., Moscow, Russia
fDate :
July 30 1995-Aug. 3 1995
Abstract :
Instability of cylindrical conducting surface microrelief fluctuations is investigated by means of small perturbation analysis using Herring chemical potential. Unstable wave-vector domain is found and effects of microtips build up and modification are discussed from the unstable modes increments viewpoint.
Keywords :
chemical potential; electromigration; perturbation theory; surface diffusion; surface topography; Herring chemical potential; cylindrical conducting surface microrelief fluctuations; electromigration instability; microtips; perturbation analysis; unstable modes; wave vectors; Chemical analysis; Chemical technology; Current density; Electromigration; Electrostatics; Equations; Fluctuations; Stability; Surface tension; Surface waves;
Conference_Titel :
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-2143-X
DOI :
10.1109/IVMC.1995.487085
