• DocumentCode
    3252979
  • Title

    Novel Capacitor-Less 1T-DRAM Using MSD Effect

  • Author

    Bawedin, M. ; Cristoloveanu, S. ; Flandre, D.

  • Author_Institution
    IMEP, INPG-Minatec, Grenoble
  • fYear
    2006
  • fDate
    2-5 Oct. 2006
  • Firstpage
    109
  • Lastpage
    110
  • Abstract
    In this paper, we propose a different single-transistor capacitor-less DRAM which is operated at low drain voltage and enables low-power applications. The basic mechanism is the meta-stable dip (MSD) effect recently discovered (Bawedin et al., 2004, 2005). MSD gives rise to a hysteresis in ID(VG) curves and a dip in transconductance gm. We demonstrate by systematic measurements and simulations that MSDRAMs with long retention time can be achieved
  • Keywords
    DRAM chips; low-power electronics; transistors; MSD effect; capacitor-less 1T-DRAM; meta-stable dip; single-transistor capacitor-less DRAM; Capacitors; Conference proceedings; Hysteresis; Impact ionization; Low voltage; MOSFETs; Random access memory; Threshold voltage; Time measurement; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International SOI Conference, 2006 IEEE
  • Conference_Location
    Niagara Falls, NY
  • ISSN
    1078-621X
  • Print_ISBN
    1-4244-0289-1
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2006.284458
  • Filename
    4062906