DocumentCode
3252979
Title
Novel Capacitor-Less 1T-DRAM Using MSD Effect
Author
Bawedin, M. ; Cristoloveanu, S. ; Flandre, D.
Author_Institution
IMEP, INPG-Minatec, Grenoble
fYear
2006
fDate
2-5 Oct. 2006
Firstpage
109
Lastpage
110
Abstract
In this paper, we propose a different single-transistor capacitor-less DRAM which is operated at low drain voltage and enables low-power applications. The basic mechanism is the meta-stable dip (MSD) effect recently discovered (Bawedin et al., 2004, 2005). MSD gives rise to a hysteresis in ID(VG) curves and a dip in transconductance gm. We demonstrate by systematic measurements and simulations that MSDRAMs with long retention time can be achieved
Keywords
DRAM chips; low-power electronics; transistors; MSD effect; capacitor-less 1T-DRAM; meta-stable dip; single-transistor capacitor-less DRAM; Capacitors; Conference proceedings; Hysteresis; Impact ionization; Low voltage; MOSFETs; Random access memory; Threshold voltage; Time measurement; Transconductance;
fLanguage
English
Publisher
ieee
Conference_Titel
International SOI Conference, 2006 IEEE
Conference_Location
Niagara Falls, NY
ISSN
1078-621X
Print_ISBN
1-4244-0289-1
Electronic_ISBN
1078-621X
Type
conf
DOI
10.1109/SOI.2006.284458
Filename
4062906
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