• DocumentCode
    3253008
  • Title

    Vacuum emission of hot electrons from GaAs

  • Author

    Fitting, H.-J. ; Hingst, T. ; Schreiber, E. ; Geib, E.

  • Author_Institution
    Fachbereich Phys., Rostock Univ., Germany
  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    468
  • Lastpage
    472
  • Abstract
    Intrinsic GaAs layers up to 3 /spl mu/m on highly doped n/sup ++/-substrate were covered with very thin Au-layers (10 nm) in order to manufacture planar field emission cathodes. At a tenfold Gunn-field of about 50 kV/cm we observe the beginning of hot and ballistic electron emission into vacuum. The energy analysis of them shows energy distributions over several eV exceeding for thick samples even 10 eV. We give a description of that high energy transport by means of Monte-Carlo calculations including acoustic and optical phonon interaction of electrons, intervalley scattering and impact ionization of valence band electrons. In a similar way, by means of vacuum emission experiments, EBIC and MC calculations we have evidenced high field transport in ZnS and SiO/sub 2/, too.
  • Keywords
    III-V semiconductors; Monte Carlo methods; cathodes; electron field emission; electron-phonon interactions; gallium arsenide; hot carriers; impact ionisation; many-valley semiconductors; vacuum microelectronics; EBIC; GaAs; Gunn field; Monte-Carlo calculations; SiO/sub 2/; ZnS; acoustic phonons; ballistic electrons; high field transport; hot electrons; impact ionization; intervalley scattering; optical phonons; planar field emission cathodes; vacuum emission; valence band electrons; Acoustic emission; Acoustic scattering; Cathodes; Electron emission; Electron optics; Gallium arsenide; Manufacturing; Optical scattering; Phonons; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.487091
  • Filename
    487091