• DocumentCode
    3253024
  • Title

    Low voltage electron emission from Pb(Zr/sub x/Ti/sub 1-x/)O/sub 3/-based thin film cathodes

  • Author

    Auciello, O. ; Ray, M.A. ; Palmer, D. ; Duarte, J. ; Ball, C. ; McGuire, G.E. ; Temple, D.

  • Author_Institution
    Div. of Electron. Technol., MCNC, Research Triangle Park, NC, USA
  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    473
  • Lastpage
    477
  • Abstract
    Electron emission from ferroelectric thin films (/spl les/1 /spl mu/m thick) is demonstrated. In addition, electron energy distributions have been measured using an Auger Electron Spectrometer (AES). The electron emission measurements were performed using ferroelectric cathodes based on thin Pb(Zr/sub 0.53/Ti/sub 0.47/)O/sub 3/ (PZT) films and 80-110 /spl mu/m Pb/sub 0.93/La/sub 0.07/ (Z/sub 0.53/Ti/sub 0.47/)O/sub 3/ (PLZT) layered capacitors with Pt top and bottom electrodes. Current densities in the range of 0.5-1.5 mA/cm/sup 2/ were measured from the PLZT cathodes excited with 100-400 volt pulses, which produced electrons of about 265 eV with a narrow energy distribution (FWHM of about 30 eV). On the other hand, current densities in the range 0.07-0.15 /spl mu/A/cm/sup 2/ were measured for thin film PZT-based cathodes excited with pulses in the range 10-40 volts. The initial results suggest that the electron emission current may depend, among other factors, on the thickness of the ferroelectric layer, the applied excitation voltage, and the interval between the polarizing and switching pulses.
  • Keywords
    Auger effect; cathodes; current density; electron field emission; ferroelectric devices; ferroelectric thin films; lanthanum compounds; lead compounds; piezoceramics; 1 micron; 10 to 40 V; 80 to 110 micron; AES; Auger electron spectroscopy; PLZT layered capacitors; PLZT-Pt; PZT films; PZT-Pt; Pb(Zr/sub x/Ti/sub 1-x/)O/sub 3/-based cathodes; PbLaZrO3TiO3-Pt; PbZrO3TiO3-Pt; Pt electrodes; applied excitation voltage; current densities; electron energy distributions; ferroelectric layer thickness; ferroelectric thin films; low voltage electron emission; polarizing pulses; switching pulses; thin film cathodes; Cathodes; Current density; Current measurement; Density measurement; Electron emission; Energy measurement; Ferroelectric materials; Low voltage; Pulse measurements; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.487092
  • Filename
    487092