• DocumentCode
    3253055
  • Title

    51 GHz frontend with flip chip and wire bond interconnections from GaAs MMICs to a planar patch antenna

  • Author

    Baumann, G. ; Richter, H. ; Baumgartner, Andreas ; Ferling, Dieter ; Heilig, R. ; Hollmann, D. ; Muller, Holger ; Nechansky, H. ; Schlechtweg, Michael

  • Author_Institution
    Alcatel SEL AG, Pforzheim, Germany
  • fYear
    1995
  • fDate
    16-20 May 1995
  • Firstpage
    1639
  • Abstract
    In this paper the difference between flip chip and wire bond technology is demonstrated. Test assemblies with coplanar waveguides have been attached in flip chip and wire bond technology and measured up to 75 GHz. Further, the influence of a metallic lid on a coplanar waveguide structure is examined. To compare flip chip and wire bond interconnections, 51 GHz frontends with GaAs devices in coplanar waveguide technology have been realized. In one frontend the low noise amplifier (LNA) is connected to a planar patch antenna by wire bonding and in a second one by flip chip attachment. RF evaluations show the clear advantage of the flip chip version due to the lower insertion loss of the flip chip interconnections and the higher flexibility of mounting the MMICs directly on the back structure of the planar patch antenna, leading to reduced losses of the feedline.<>
  • Keywords
    MMIC amplifiers; coplanar waveguides; flip-chip devices; integrated circuit interconnections; lead bonding; microassembling; microstrip antenna arrays; millimetre wave antennas; millimetre wave receivers; 51 GHz; CPW technology; GaAs; GaAs MMIC; LNA; MM-wave frontend; coplanar waveguides; flip chip interconnections; insertion loss; low noise amplifier; metallic lid; planar patch antenna; wire bond interconnections; Assembly; Bonding; Coplanar waveguides; Flip chip; Gallium arsenide; Patch antennas; Semiconductor device measurement; Testing; Waveguide components; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1995., IEEE MTT-S International
  • Conference_Location
    Orlando, FL, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-2581-8
  • Type

    conf

  • DOI
    10.1109/MWSYM.1995.406291
  • Filename
    406291