Title :
Study of Staggered Fusion Imaging Principle of CMOS Image Sensor
Author :
Yan, Yong-Hong ; Qin, Chun-Sheng
Author_Institution :
Sch. of Phys. & Microelectron. Sci., Hunan Univ., Changsha, China
Abstract :
In order to improve the performance and the resolution of the CMOS image sensors, a new method of staggered fusion imaging of CMOS image sensor was presented in this paper. In the staggered fusion process, four CMOS images were taken staggeringly in half pixel offset in directions of horizontal, vertical and diagonal and then were composed into one image. Theoretical analysis about the relations of pixel gray-level of original multi-images taken by CMOS image sensor and the reconstructed new image proved that resolution of the reconstructed new image of CMOS sensor can be raised by 4 times than the original images. In the simulation experiments done afterwards we did get the higher resolution reconstructed image from lower resolution images. The experimental results verify the theory analysis well. It indicated that the staggered fusion imaging method is promising for the future development of higher performance and lower price CMOS image sensors.
Keywords :
CMOS image sensors; image fusion; image reconstruction; image resolution; optical images; CMOS image sensor; image reconstruction; image resolution; staggered fusion imaging; CMOS image sensors; CMOS technology; Costs; Image reconstruction; Image resolution; Lighting; Optical imaging; Pixel; Signal resolution; Spatial resolution;
Conference_Titel :
Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4412-0
DOI :
10.1109/SOPO.2009.5230210