Title :
Influence of Temperature and Stress Field on Optical Voltage Sensor
Author :
Xia, Xiao ; Xu Yan ; Xu Ken ; Ye Miao-yuan
Author_Institution :
Coll. of Electr. & Electron. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
The influence of temperature field and stress field on OVS has been analyzed theoretically. The law that temperature Held and stress field affect the stability of optical voltage sensor (OVS) was obtained. Namely, thermal-optic effect by temperature and elato-optic by compressive stress of SF6 have no influence on the performance of OVS, but the phase retardation resulted through thermal-stress by the temperature variation is superimposed on the phase retardation produced through elastro-optic effect and varies with temperature, which affects the stability of OVS.
Keywords :
optical sensors; voltage measurement; compressive stress; elato-optic; optical voltage sensor; phase retardation; stress field effect; temperature effect; thermal-optic effect; Compressive stress; Electric variables measurement; Optical distortion; Optical refraction; Optical sensors; Optical variables control; Power system stability; Temperature sensors; Thermal stresses; Voltage;
Conference_Titel :
Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4412-0
DOI :
10.1109/SOPO.2009.5230216
