DocumentCode :
3253223
Title :
Outlier detection from multidimensional space using multilayer perceptron, RBF networks and pattern clustering techniques
Author :
Sinwar, Deepak ; Dhaka, V.S.
Author_Institution :
Sch. of Comput. & Syst. Sci., Jaipur Nat. Univ., Jaipur, India
fYear :
2015
fDate :
19-20 March 2015
Firstpage :
573
Lastpage :
579
Abstract :
As we know that Outlier detection is one of the important aspects of Data Mining, which generally aims to identify potential outliers from datasets. Outliers may sometimes plays important role while taking effective business decisions. This work provides a study of various outlier detection techniques and compares their effectiveness in terms of number of outlier detection, kappa statistic and mean absolute error. Seven algorithms of different categories were tested on three real world datasets to validate the study. We have used pattern based detection of outliers using Multilayer Perceptron, Radial Basis Function Networks, Naïve Bayes Classifiers and Pattern Clustering techniques viz. K-Means, EM and the Agglomerative Hierarchical Clustering. Experimental results show that the Hierarchical Clustering outperforms all other algorithms in terms of number of outlier detection, whereas Multilayer Perceptron and J48 Decision Tree have the highest Kappa Statistic measure. Performance of EM clustering was worst amongst all the algorithms because it was unable to classify all the instances; whereas the performance of RBF Networks and Naïve Bayes Classifiers was almost same and not so satisfactory in terms of outlier detection percentage, Kappa Statistic and Mean Absolute Error.
Keywords :
Bayes methods; data mining; decision trees; multilayer perceptrons; pattern classification; pattern clustering; radial basis function networks; statistical analysis; EM; J48 decision tree; RBF networks; agglomerative hierarchical clustering; business decisions; data mining; highest kappa statistic measure; k-means; mean absolute error; multidimensional space; multilayer perceptron; naïve Bayes classifiers; outlier detection; outlier detection percentage; pattern based detection; pattern clustering techniques; radial basis function networks; Classification algorithms; Clustering algorithms; Computers; Data mining; Decision trees; Diabetes; Multilayer perceptrons; Clustering; Data Mining; Dataset; Multilayer Perceptron; Outlier; RBF Networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Engineering and Applications (ICACEA), 2015 International Conference on Advances in
Conference_Location :
Ghaziabad
Type :
conf
DOI :
10.1109/ICACEA.2015.7164757
Filename :
7164757
Link To Document :
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