DocumentCode :
3253292
Title :
Source/Drain Extension Region Engineering in Nanoscale Double Gate MOSFETs for Low-Voltage Analog Applications
Author :
Kranti, Abhinav ; Lim, Tao Chuan ; Armstrong, G. Alastair
Author_Institution :
Northern Ireland Semicond. Res. Center, Queen´´s Univ. Belfast
fYear :
2006
fDate :
2-5 Oct. 2006
Firstpage :
141
Lastpage :
142
Abstract :
A novel design methodology to simultaneously improve Avo and fT for low-voltage/low-power analog applications was proposed for the first time using symmetric/asymmetric SDE regions. A significant improvement of about 50% in voltage gain and 85% in cut-off frequency can be achieved by optimally engineered SDE regions as compared to devices with abrupt source/drain regions. The present work provides new opportunities for realizing future low-voltage analog circuits with nanoscale SDE engineered DG MOSFETs
Keywords :
MOSFET; analogue circuits; nanoelectronics; asymmetric SDE regions; drain extension region engineering; low-power analog applications; low-voltage analog applications; low-voltage analog circuits; nanoscale SDE DG MOSFET; nanoscale double gate MOSFET; source extension region engineering; symmetric SDE regions; Analytical models; Conference proceedings; Cutoff frequency; Degradation; Design methodology; Doping; Intrusion detection; MOS devices; MOSFETs; Nanoscale devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
International SOI Conference, 2006 IEEE
Conference_Location :
Niagara Falls, NY
ISSN :
1078-621X
Print_ISBN :
1-4244-0289-1
Electronic_ISBN :
1078-621X
Type :
conf
DOI :
10.1109/SOI.2006.284475
Filename :
4062923
Link To Document :
بازگشت