DocumentCode :
3253381
Title :
Sequential short-term reliability evaluation considering repair time distribution
Author :
Cheng, Lin ; Ye, Xiaohui ; He, Jian ; Sun, Yuanzhang
Author_Institution :
Electr. Eng. Dept., Tsinghua Univ., Beijing, China
fYear :
2010
fDate :
14-17 June 2010
Firstpage :
178
Lastpage :
183
Abstract :
The performance of a power system in an operational time frame can be evaluated by the short-term reliability assessment. The component reliability model usually uses exponential distribution for the repair time because of its simplicity. However, this assumption may lead to the inaccuracy in evaluation results, especially large errors in short-term evaluation. Therefore, the non-exponential distribution of repair time should be modeled. Unlike the exponential distribution model, the non-exponential distribution model has the property of “memory”, i.e., historical repair time has great influence on the component´s availability in a very short time interval. This influence cannot be identified by traditional non-sequential evaluation methods. Thus, this paper proposes a sequential short-term reliability evaluation method to obtain more accurate indices by considering all the factors described above. A comparison study between the proposed method and non-sequential method is present and the method´s advantages are illustrated using IEEE Reliability Test System.
Keywords :
Monte Carlo methods; exponential distribution; power system reliability; IEEE Reliability Test System; Monte Carlo simulation; component reliability model; exponential distribution; nonexponential distribution; power system; probability distribution function; repair time distribution; sequential short-term reliability evaluation method; short-term reliability assessment; Exponential distribution; Helium; Power system control; Power system modeling; Power system planning; Power system reliability; Power system simulation; Power systems; Real time systems; Sun; historical repair time; power system; probability distribution function; sequential Monte Carlo simulation; short-term reliability evaluation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Probabilistic Methods Applied to Power Systems (PMAPS), 2010 IEEE 11th International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5720-5
Type :
conf
DOI :
10.1109/PMAPS.2010.5528995
Filename :
5528995
Link To Document :
بازگشت