DocumentCode :
3253622
Title :
Substantiation of numerical analysis methodology for CPU package with non-uniform heat dissipation and heat sink with simplified fin modeling
Author :
Gektin, Vadim ; Zhang, Ron ; Vogel, Marlin ; Xu, Guoping ; Lee, Mario
Author_Institution :
Sun Microsyst. Inc., Santa Clara, CA, USA
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
537
Abstract :
Thermal design in electronic packaging is driven by the maximum allowable junction temperature of a CPU. An inadequate thermal design that underestimates the junction temperature may adversely impact the electrical performance of the CPU, making predicting the junction temperature a crucial step in package and system thermal design. A numerical model of a heat sink and thermal test package with a uniform and non-uniform power dissipation was created and used to predict their temperatures. The uniform power dissipation case was used to calibrate the numerical model´s TIM2 thermal impedance. In the non-uniform power cases, the maximum heat flux was over four times higher than the average heat flux. The numerical analysis results in the non-uniform power cases yielded junction temperatures within 2 degrees of the measured values. The heat sink used in the tests as well as numerically modeled contained a vapor chamber base and a plate heat sink. Three different heat sink modeling approaches were used, including: detailed modeling of the heat sink, effective convection coefficient heff, and effective thermal conductivity keff. Test data was used to establish the effective heat transfer coefficient and effective thermal conductivity. A simplified heat sink numerical model allows the computational grid density to be significantly reduced, resulting in fast convergence. Alternate heat sink designs were also considered.
Keywords :
computational fluid dynamics; convection; cooling; heat sinks; microprocessor chips; thermal conductivity; thermal management (packaging); thermal resistance; CPU package; computational grid density; convection coefficient; electrical properties; electronic packaging; fin modeling; heat flux; heat sink design; heat sink modeling; heat transfer coefficient; junction temperature; nonuniform heat dissipation; nonuniform power dissipation; numerical analysis; thermal conductivity; thermal design; thermal impedance; thermal test package; uniform power dissipation; vapor chamber; Electronic packaging thermal management; Electronics packaging; Heat sinks; Numerical analysis; Numerical models; Power dissipation; Power system modeling; Temperature; Testing; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
Print_ISBN :
0-7803-8357-5
Type :
conf
DOI :
10.1109/ITHERM.2004.1319221
Filename :
1319221
Link To Document :
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