Title :
Harmonic characterization of mismatches in deep sub-micron varactors for a digitally controlled RF oscillator
Author :
Waheed, Khurram ; Staszewski, Robert Bogdan
Author_Institution :
Wireless Mixed-Signal Technol. Center, Texas Instruments, Inc., Dallas, TX
Abstract :
Precise modeling and understanding of all nonlinear characteristics in radio-frequency (RF) CMOS circuits is a pre-requisite to the successful integration of modern CMOS radios. This paper summarizes a harmonic characterization techniques used to estimate the mismatches in the minimal size inversion-type CMOS tuning varactors of a digitally controlled RF oscillator (DCO). The DCO is the centerpiece of the first ever all-digital phase locked loop (ADPLL) fabricated in 90 nm digital CMOS that meets the challenging GSM performance specifications. Full-scale VHDL simulations as well as lab measurements confirm that the tracking bank varactors have a better than 5% mismatch, thus contributing to the excellent modulation performance of the RF chip
Keywords :
CMOS integrated circuits; digital phase locked loops; harmonic oscillators (circuits); integrated circuit modelling; radiofrequency integrated circuits; radiofrequency oscillators; varactors; 90 nm; CMOS radio; CMOS tuning varactor; GSM performance specification; RF chip; VHDL simulation; all-digital phase locked loop; deep submicron varactor; digitally controlled RF oscillator; harmonic characterization; mismatch estimation; radio-frequency CMOS circuit; Circuit optimization; Digital control; GSM; Oscillators; Phase locked loops; Radio frequency; Semiconductor device modeling; Size control; Tuning; Varactors;
Conference_Titel :
Circuits and Systems, 2005. 48th Midwest Symposium on
Conference_Location :
Covington, KY
Print_ISBN :
0-7803-9197-7
DOI :
10.1109/MWSCAS.2005.1594260