Title :
Technology Performance Comparison of Triacs Subjected to Fast Transient Voltages
Author :
Gonthier, L. ; Passal, A.
Author_Institution :
IMS/ASD & IP AD, Tours
Abstract :
This paper presents an experimental comparison of several Triac devices under immunity tests, as described in the IEC 61000-4-4 standard. After a short reminder of the different Triac technologies available today (TOP, MESA and PLANAR technologies), the IEC 61000-4-4 test procedure to compare the devices is explained. The immunity results are discussed according to the devices´ technology and the gate current sensibilities. A discussion about relevance of dV/dt parameter and die area is carried on to differentiate the devices in term of immunity capability.
Keywords :
electromagnetic compatibility; immunity testing; power semiconductor switches; thyristor applications; transients; IEC 61000-4-4 standard; dV/dt parameter; die area; gate current sensibility; immunity tests; transient voltages; triac devices; Electromagnetic transients; Glass; Home appliances; IEC standards; Immunity testing; Passivation; Silicon; Switches; Thyristors; Voltage;
Conference_Titel :
Power Electronics and Drive Systems, 2007. PEDS '07. 7th International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4244-0645-6
Electronic_ISBN :
978-1-4244-0645-6
DOI :
10.1109/PEDS.2007.4487682
