DocumentCode :
3253785
Title :
Toward Intelligent Software Defect Detection - Learning Software Defects by Example
Author :
Benson, Markland J.
Author_Institution :
Software Eng. Div., NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear :
2011
fDate :
20-21 June 2011
Firstpage :
138
Lastpage :
142
Abstract :
Source code level software defect detection has gone from state of the art to a software engineering best practice. Automated code analysis tools streamline many of the aspects of formal code inspections but have the drawback of being difficult to construct and either prone to false positives or severely limited in the set of defects that can be detected. Machine learning technology provides the promise of learning software defects by example, easing construction of detectors and broadening the range of defects that can be found. Pinpointing software defects with the same level of granularity as prominent source code analysis tools distinguishes this research from past efforts, which focused on analyzing software engineering metrics data with granularity limited to that of a particular function rather than a line of code.
Keywords :
learning (artificial intelligence); program diagnostics; software metrics; automated code analysis tool; formal code inspection; intelligent software defect detection; machine learning; software engineering metrics; source code level software defect detection; Feature extraction; Machine learning; Measurement; Presses; Software; Software engineering; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering Workshop (SEW), 2011 34th IEEE
Conference_Location :
Limerick
ISSN :
1550-6215
Print_ISBN :
978-1-4673-0245-6
Type :
conf
DOI :
10.1109/SEW.2011.26
Filename :
6146920
Link To Document :
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