Title :
On-line Junction Temperature Measurement of CoolMOS Devices
Author :
Koenig, Andreas ; Plum, Thomas ; Fidler, Peter ; De Doncker, Rik W.
Author_Institution :
RWTH Aachen Univ., Aachen
Abstract :
To operate power electronic devices at high ambient temperatures it has to be ensured that the maximum specified junction temperature is not exceeded at any time during operation. This paper presents a method to calculate the actual junction temperature by measuring voltage and current at a power MOSFET during operation of a converter. Based on this temperature, the actual transferred power of a converter can be controlled to ensure a safe operation within the specified temperature limits.
Keywords :
DC-DC power convertors; electric current measurement; power MOSFET; power electronics; semiconductor device measurement; semiconductor junctions; temperature measurement; voltage measurement; CoolMOS devices; current measurement; on-line junction temperature measurement; power MOSFET; power converter; power electronic devices; voltage measurement; Electric variables measurement; MOSFET circuits; Power MOSFET; Power electronics; Power measurement; Power system reliability; Semiconductor devices; Temperature control; Temperature dependence; Temperature measurement;
Conference_Titel :
Power Electronics and Drive Systems, 2007. PEDS '07. 7th International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4244-0645-6
Electronic_ISBN :
978-1-4244-0645-6
DOI :
10.1109/PEDS.2007.4487683
