DocumentCode :
3254126
Title :
Fast, automated thermal simulation of three-dimensional integrated circuits
Author :
Wilkerson, Patrick ; Raman, Ashok ; Turowski, Marek
Author_Institution :
CFD Res. Corp., Huntsville, AL, USA
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
706
Abstract :
Three-dimensional (3D) stacked integrated circuits (ICs) can significantly improve circuit performance and offer the promise of integrating various technologies (memory, logic, RF, mixed-signal, optoelectronics) within a single block. Lack of 3D design tools and heat dissipation from vertically stacked multiple layers are the crucial problems in their development. To address these issues, CFD Research Corporation (CFDRC) is developing methodologies and tools to analyze and assess coupled electrical and thermal performance of 3D ICs, including calculation of realistic full-chip thermal distributions and determining from them signal delay/distortion. Due to the stacking technology, extensive localized heating can occur. Analysis to minimize these hot spots using thermal vias is demonstrated. Our Python-script based framework allows to drive and control all the aspects of the 3D model building (directly from layouts), thermal simulations, and results extraction/post-processing. Hence, it is a good basis for coupling with Electronic Design Automation (EDA) systems. We present results of automated, fast, but detailed thermal simulations of 3D stacked integrated circuits. In addition, procedures for automatic extraction of reduced and compact thermal-resistance-based 3D models have been implemented. These techniques greatly reduce required computational time, and allow for very fast parametric modeling analysis of 3D IC design configurations and temperature extraction. From these thermal resistance models, equivalent SPICE netlists may be generated and used for independent or coupled thermal analysis.
Keywords :
SPICE; automation; convection; cooling; electronic design automation; elemental semiconductors; enthalpy; glass; integrated circuit design; integrated circuit packaging; permittivity; silicon-on-insulator; stacking; thermal analysis; thermal conductivity; thermal resistance; 3D model building; 3D stacked IC; 3D thermal resistance model; CFD Research Corporation; EDA system; Python script based network; Python-script based framework; RF integration; SPICE; Si; automated thermal simulation; electrical properties; electronic design automation system; full chip thermal distribution; heat dissipation; heating; hot spots; logic integration; memory integration; mixed signal integration; multilayers; optoelectronics; signal delay; thermal analysis; thermal properties; thermal resistance; thermal signal delay; thermal signal distortion; thermal simulations; three-dimensional stacked integrated circuits; vertically stacked multiple layers; Circuit optimization; Circuit simulation; Electronic design automation and methodology; Integrated circuit modeling; Integrated circuit technology; Logic circuits; Radio frequency; Radiofrequency integrated circuits; Thermal resistance; Three-dimensional integrated circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
Print_ISBN :
0-7803-8357-5
Type :
conf
DOI :
10.1109/ITHERM.2004.1319245
Filename :
1319245
Link To Document :
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