Title :
Stochastic Glitch Estimation and Path Balancing for Statistical Optimization
Author :
Shin, Hosun ; Zang, Naeun ; Kim, Juho
Author_Institution :
MOMORY Div., Samsung Electron. Co., Ltd., Seoul
Abstract :
Statistical power optimization using the probabilistic delay model is introduced in this paper. We propose a new method for power optimization that uses path balancing based on stochastic estimation of glitch in statistical static timing analysis (SSTA). The proposed method estimates the probability of glitch occurrence using tightness probability of each node in timing graph. In addition, we propose efficient gate sizing technique for glitch reduction using accurate calculation of sizing effect in delay considering probability of glitch occurrence. The efficiency of the proposed method has been verified on ISCAS 85 benchmark circuits with 0.16 mum model parameters. Experimental results show up to 8.6% of accuracy improvement in glitch estimation and 9.5% of optimization improvement.
Keywords :
circuit optimisation; integrated circuit modelling; low-power electronics; statistical analysis; stochastic processes; ISCAS 85 benchmark circuits; gate sizing technique; glitch reduction; path balancing; probabilistic delay model; size 0.16 mum; statistical power optimization; statistical static timing analysis; stochastic glitch estimation; tightness probability; timing graph; CMOS technology; Computer aided engineering; Computer science; Delay effects; Delay estimation; Optimization methods; Power engineering and energy; Probability distribution; Stochastic processes; Timing;
Conference_Titel :
SOC Conference, 2006 IEEE International
Conference_Location :
Taipei
Print_ISBN :
0-7803-9781-9
Electronic_ISBN :
0-7803-9782-7
DOI :
10.1109/SOCC.2006.283851