Title :
The Analysis of Photoresist´s Absorption Spectrum by THz-TDS
Author :
Wang Xueguang ; Lang Liying
Author_Institution :
Coll. of Inf. & Electr. Eng., Hebei Univ. of Eng., Handan, China
Abstract :
Using terahertz time domain spectroscopy (THz-TDS), the photoresist´s absorption spectrum was measured in this paper. From the experimental data, A significant difference was found in the absorption between the exposure and unexposure photoresist. And we also discuss the requirements to sample preparation imposed by the lack of sharp spectral features in the absorption specra. The experimental results show that the THz-TDS is useful to measure the material spectra and can be effective to analysis their character.
Keywords :
photoresists; terahertz wave spectra; time resolved spectra; exposure photoresist; material spectra; photoresist absorption spectrum; terahertz time domain spectroscopy; unexposure photoresist; Biological materials; Electromagnetic radiation; Electromagnetic wave absorption; Electron beams; Ion beams; Resists; Semiconductor materials; Spectroscopy; Time measurement; X-ray lasers;
Conference_Titel :
Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4412-0
DOI :
10.1109/SOPO.2009.5230286