Title :
The design of automatic-lock-automatic-retrieve single-chip IPM for converter systems
Author :
Chang, Lon-Kou ; Tsai, Ming-Yui
Author_Institution :
Inst. of Electron. & Control Eng., Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
This paper describes a single-chip intelligent power module (IPM) manufactured by utilizing a modified high voltage BCD process that integrates power devices, LIGBTs, and protection circuits on the SOI substrate. The smart integrated circuits provide automatic-lock-automatic-retrieve sensing and protection functions to give strong and fast protection ability against faults of over-on-state-voltage, over-current, and over-temperature; those are specially designed for power converter usage. When the gate voltage of LIGBT is high and the faulty event is sensed, the protection circuit pulls down the gate voltage to low and toggles LIGBT to off state immediately. However, each time the gate voltage returns to high, LIGBT is retrieved to the normal operating condition automatically. Therefore, the proposed IPM is superior to the converters with pulse-width-modulation (PWM) applications
Keywords :
insulated gate bipolar transistors; power convertors; power integrated circuits; LIGBTs; automatic-lock-automatic-retrieve sensing; automatic-lock-automatic-retrieve single-chip IPM; converter systems; faulty event; gate voltage; high voltage BCD process; intelligent power module; operating condition; over-current; over-on-state-voltage; over-temperature; protection circuits; smart integrated circuits; Circuit faults; Insulated gate bipolar transistors; Multichip modules; Power electronics; Power system protection; Power system reliability; Pulse width modulation; Pulse width modulation converters; Switching converters; Voltage;
Conference_Titel :
VLSI Technology, Systems, and Applications, 2001. Proceedings of Technical Papers. 2001 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
0-7803-6412-0
DOI :
10.1109/VTSA.2001.934528