Title :
Layout issues in bus encoding schemes
Author :
Vemuru, Srinivasa R ; Elkammar, Ahmed N ; Scheinberg, Norman ; Niamat, Mohammed Y.
Author_Institution :
Dept. of ECE & CS, Ohio Northern Univ., Ada, OH, USA
Abstract :
With the scaling down of device and interconnect dimensions in very deep submicron technology, the increased wire aspect ratio and the reduced spacing between the individual wires within a bus results in increased cross-coupling capacitances. This increases crosstalk noise and power dissipation particularly in wide data buses. A number of schemes have been proposed that reduce correlated and self-switching among bus wires using additional control signals. We study the impact of layout related issues on some of the bus encoding schemes.
Keywords :
VLSI; crosstalk; integrated circuit interconnections; integrated circuit layout; bus encoding schemes; bus wires; cross-coupling capacitances; crosstalk noise; power dissipation; wide data buses; CMOS process; CMOS technology; Capacitance; Cities and towns; Crosstalk; Data buses; Delay; Encoding; Power dissipation; Wires;
Conference_Titel :
Circuits and Systems, 2005. 48th Midwest Symposium on
Print_ISBN :
0-7803-9197-7
DOI :
10.1109/MWSCAS.2005.1594318