• DocumentCode
    3254726
  • Title

    Fast placement-dependent full chip thermal simulation

  • Author

    Zhiping Yu ; Yergeau, D. ; Dutton, R.W. ; Nakagawa, Sachiko

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    249
  • Lastpage
    252
  • Abstract
    A general purpose semiconductor device/process simulator, PROPHET, has been adapted for full chip thermal analysis and is capable of quickly (~1 minute CPU time) assessing the impact of functional block placement on chip temperature distribution. The key to fast simulation is a new algorithm which maps the heat generation of functional blocks to a coarse mesh while maintaining conservation of heat generating sources. Design of two high-performance CPU chips based on bulk CMOS and SOI technologies, with total power consumption of 100 and 60 watts, respectively, has been evaluated for thermal performance using this approach. Excellent results have been achieved in terms of benchmarked accuracy and computational efficiency. Up to seven interconnect layers have been included in the simulation; effects of packaging are modeled using two capping thermally resistive layers on top and bottom of the chip. Considering the extremely non-uniform nature of interconnect/interleaving-insulating layers, anisotropic thermal conductivity is a critical factor in modeling thermal properties and has been implemented in the simulator. The potential benefit of using pure silicon (Si-28), which has a higher thermal conductivity than that of natural silicon (1.6 times as big at the room temperature), in reducing the peak chip temperature has also been studied. It is shown that with a power consumption level of 100 watts, the peak temperature can be lowered by about 10% (from 136 to 123°C)
  • Keywords
    circuit simulation; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; temperature distribution; thermal conductivity; 100 W; 123 degC; 60 W; PROPHET; anisotropic thermal conductivity; capping thermally resistive layers; chip temperature distribution; computational efficiency; functional block placement; heat generating sources; heat generation; high-performance CPU chips; interconnect layers; peak chip temperature; placement-dependent full chip thermal simulation; power consumption level; Analytical models; CMOS technology; Computational efficiency; Energy consumption; Mesh generation; Semiconductor devices; Silicon; Temperature distribution; Thermal conductivity; Thermal factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems, and Applications, 2001. Proceedings of Technical Papers. 2001 International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    0-7803-6412-0
  • Type

    conf

  • DOI
    10.1109/VTSA.2001.934531
  • Filename
    934531