DocumentCode :
3254726
Title :
Fast placement-dependent full chip thermal simulation
Author :
Zhiping Yu ; Yergeau, D. ; Dutton, R.W. ; Nakagawa, Sachiko
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA
fYear :
2001
fDate :
2001
Firstpage :
249
Lastpage :
252
Abstract :
A general purpose semiconductor device/process simulator, PROPHET, has been adapted for full chip thermal analysis and is capable of quickly (~1 minute CPU time) assessing the impact of functional block placement on chip temperature distribution. The key to fast simulation is a new algorithm which maps the heat generation of functional blocks to a coarse mesh while maintaining conservation of heat generating sources. Design of two high-performance CPU chips based on bulk CMOS and SOI technologies, with total power consumption of 100 and 60 watts, respectively, has been evaluated for thermal performance using this approach. Excellent results have been achieved in terms of benchmarked accuracy and computational efficiency. Up to seven interconnect layers have been included in the simulation; effects of packaging are modeled using two capping thermally resistive layers on top and bottom of the chip. Considering the extremely non-uniform nature of interconnect/interleaving-insulating layers, anisotropic thermal conductivity is a critical factor in modeling thermal properties and has been implemented in the simulator. The potential benefit of using pure silicon (Si-28), which has a higher thermal conductivity than that of natural silicon (1.6 times as big at the room temperature), in reducing the peak chip temperature has also been studied. It is shown that with a power consumption level of 100 watts, the peak temperature can be lowered by about 10% (from 136 to 123°C)
Keywords :
circuit simulation; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; temperature distribution; thermal conductivity; 100 W; 123 degC; 60 W; PROPHET; anisotropic thermal conductivity; capping thermally resistive layers; chip temperature distribution; computational efficiency; functional block placement; heat generating sources; heat generation; high-performance CPU chips; interconnect layers; peak chip temperature; placement-dependent full chip thermal simulation; power consumption level; Analytical models; CMOS technology; Computational efficiency; Energy consumption; Mesh generation; Semiconductor devices; Silicon; Temperature distribution; Thermal conductivity; Thermal factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, Systems, and Applications, 2001. Proceedings of Technical Papers. 2001 International Symposium on
Conference_Location :
Hsinchu
ISSN :
1524-766X
Print_ISBN :
0-7803-6412-0
Type :
conf
DOI :
10.1109/VTSA.2001.934531
Filename :
934531
Link To Document :
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