• DocumentCode
    3254922
  • Title

    Negative and positive ions in liquid helium

  • Author

    Khrapak, Alexey G. ; Schmidt, Werner F.

  • Author_Institution
    Joint Inst. for High Temps., Russian Acad. of Sci., Moscow, Russia
  • fYear
    2011
  • fDate
    26-30 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Structure and properties of positive and negative ions in liquid 4He are analyzed. The possibility of clusters or bubbles formation around impurity ions of both signs is discussed. It is demonstrated that in superfluid helium around negative alkaline-earth metal ions bubbles are formed and around halogen ions clusters are formed. The nature of “fast” and “exotic” negative ions is also discussed. It is assumed that the “fast” ions are negative ions of helium excimer molecules localized inside bubbles. The “exotic” ions are stable negative impurity ions, which are always present in small amounts in gas discharge plasma. Around such ions bubbles or clusters are created with radius smaller the radius of electron bubbles.
  • Keywords
    barium; beryllium; bubbles; cadmium; caesium; chlorine; discharges (electric); electron mobility; fluorine; gallium; impurity distribution; iodine; liquid structure; molecular clusters; negative ions; positive ions; potassium; rubidium; segregation; strontium; superfluid helium-4; superfluidity; He:Ba; He:Be; He:Cd; He:Cl; He:Cs; He:F; He:Ga; He:I; He:K; He:Rb; He:Sr; electron bubbles; gas discharge plasma; halogen ions cluster formation; helium excimer molecules; impurity ions; liquid helium-4; negative alkaline-earth metal ions bubble formation; negative ions; positive ions; structural properties; superfluid helium; Atomic measurements; Cavity resonators; Helium; Impurities; Ions; Metals; Solids; electron and ion bubbles; liquid helium; mobility; negative ions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dielectric Liquids (ICDL), 2011 IEEE International Conference on
  • Conference_Location
    Trondheim
  • ISSN
    2153-3725
  • Print_ISBN
    978-1-4244-7352-6
  • Electronic_ISBN
    2153-3725
  • Type

    conf

  • DOI
    10.1109/ICDL.2011.6015425
  • Filename
    6015425