Title :
Using syndrome compression for memory built-in self-diagnosis
Author :
Li, Jin-Fu ; Tzeng, Ruey-Shing ; Wu, Cheng-Wen
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Due to the pin-count limitation, built-in self-diagnosis (BISD) for embedded RAMs usually exports diagnosis information serially, which results in the overhead of diagnostic time. This paper describes a tree-based compression technique for word-oriented memories. The technique can speed up the transmission of diagnosis data from the embedded RAM with BISD support. By using a simplified Huffman coding scheme and partitioning each 256-bit Hamming syndrome into fixed-size symbols, the average compression ratio is reduced to about 10%, assuming 16-bit symbols. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage requirement
Keywords :
Huffman codes; VLSI; built-in self test; data compression; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; random-access storage; tree codes; BISD; BIST; Hamming syndrome partitioning; diagnostic test time reduction; embedded RAMs; fixed-size symbols; memory built-in self-diagnosis; simplified Huffman coding scheme; syndrome compression; tester storage requirement reduction; tree-based compression technique; word-oriented memories; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Coupling circuits; Displays; Fault detection; Huffman coding; Random access memory; Read-write memory;
Conference_Titel :
VLSI Technology, Systems, and Applications, 2001. Proceedings of Technical Papers. 2001 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
0-7803-6412-0
DOI :
10.1109/VTSA.2001.934545
