• DocumentCode
    3255323
  • Title

    High performance stacked LDD RF LDMOSFET

  • Author

    Cai, Jun ; Ren, Changhong ; Balasubramanian, N. ; Sin, Johnny K O

  • Author_Institution
    Inst. of Microelectron., Singapore
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    103
  • Lastpage
    106
  • Abstract
    A novel silicon RF LDMOSFET structure, using a simple yet effective concept of stacked LDD, is proposed. The stacked layers of LDD minimises the on-state resistance of the transistor due to the n+ doping used in the top LDD layer, and also raises the device breakdown voltage due to the charge compensation in the composite LDD region. Therefore, for the same blocking voltage rating, the stacked LDD structure allows the LDMOSFET to have a higher current handling capability. This in turn causes the transconductance Gm to be higher, leading to higher RF performance for the power device
  • Keywords
    charge compensation; power MOSFET; blocking voltage rating; charge compensation; device breakdown voltage; high performance stacked LDD RF LDMOSFET; higher current handling capability; on-state resistance; stacked layers; Doping; Electric resistance; Feedback; Microelectronics; Parasitic capacitance; Personal communication networks; Radio frequency; Silicon compounds; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 2001. ISPSD '01. Proceedings of the 13th International Symposium on
  • Conference_Location
    Osaka
  • ISSN
    1063-6854
  • Print_ISBN
    4-88686-056-7
  • Type

    conf

  • DOI
    10.1109/ISPSD.2001.934567
  • Filename
    934567