DocumentCode
3255323
Title
High performance stacked LDD RF LDMOSFET
Author
Cai, Jun ; Ren, Changhong ; Balasubramanian, N. ; Sin, Johnny K O
Author_Institution
Inst. of Microelectron., Singapore
fYear
2001
fDate
2001
Firstpage
103
Lastpage
106
Abstract
A novel silicon RF LDMOSFET structure, using a simple yet effective concept of stacked LDD, is proposed. The stacked layers of LDD minimises the on-state resistance of the transistor due to the n+ doping used in the top LDD layer, and also raises the device breakdown voltage due to the charge compensation in the composite LDD region. Therefore, for the same blocking voltage rating, the stacked LDD structure allows the LDMOSFET to have a higher current handling capability. This in turn causes the transconductance Gm to be higher, leading to higher RF performance for the power device
Keywords
charge compensation; power MOSFET; blocking voltage rating; charge compensation; device breakdown voltage; high performance stacked LDD RF LDMOSFET; higher current handling capability; on-state resistance; stacked layers; Doping; Electric resistance; Feedback; Microelectronics; Parasitic capacitance; Personal communication networks; Radio frequency; Silicon compounds; Transconductance; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs, 2001. ISPSD '01. Proceedings of the 13th International Symposium on
Conference_Location
Osaka
ISSN
1063-6854
Print_ISBN
4-88686-056-7
Type
conf
DOI
10.1109/ISPSD.2001.934567
Filename
934567
Link To Document