DocumentCode :
3255755
Title :
Radio frequency characterization of bonding wire interconnections in a molded chip
Author :
Chuang, Jun Yi ; Tseng, Sung Pi ; Yeh, J. Andrew
Author_Institution :
Inst. of Microelectromech. Syst., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume :
1
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
392
Abstract :
Radio frequency characteristics at frequencies ranging from 0.1 GHz to 10 GHz of bonding wire interconnections in a low-cost lightweight 64 pin 9 mm×9 mm molded chip were investigated. The work in this paper was performed to realize the length effect, parasitic effect, impedance matching, and crosstalk phenomena of bonding wires in a molded chip. Bonding wires of length between 2 mm (the shortest) and 2.5 mm (the longest) in our molded chips were selected as test samples. Agreement between measurements and simulations from HFSS was observed, across 10 GHz of bandwidth, to be within 1 dB for return loss and 0.2 dB for insertion loss, respectively. Experimental results of 2 mm and 2.5 mm long bonding wires show that resistive and inductive effects of the wires themselves (i.e. length effect) have little impact on S-parameters in these test chips. In addition, the RF performance with a proposed matching capacitor to the G-S-G single-ended bonding wire and crosstalk phenomena between two adjacent signal wires was also evaluated. This research also shows definitely that parasitic effects result from the molding and pads in these test chips play certainly important roles on insertion loss and return loss.
Keywords :
S-parameters; crosstalk; impedance matching; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; lead bonding; 0.1 to 10 GHz; 10 GHz; 2 mm; 2.5 mm; 9 mm; G-S-G single-ended bonding wire; S-parameters; bonding wire RF characterization; bonding wire interconnections; crosstalk phenomena; impedance matching; inductive effects; insertion loss; length effect; low-cost lightweight chip; matching capacitor; molded chip; parasitic effect; resistive effects; return loss; Bandwidth; Bonding; Crosstalk; Impedance matching; Insertion loss; Loss measurement; Radio frequency; Semiconductor device measurement; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
Type :
conf
DOI :
10.1109/ECTC.2004.1319370
Filename :
1319370
Link To Document :
بازگشت