Soft-switching turn-off characterization at high temperature of 1200 V trench IGBT using local lifetime control

This study proposes a turn-off switching losses investigation at high temperature of 1200 V Trench IGBT using local lifetime control under soft-switching. Both zero-voltage and zero-current switching test configurations performed under various test conditions (dv/dt, di/dt, gate resistance, peak collector current, clamping voltage, temperature, hold-off time) allow to establish comparative diagrams and graphs performances with conventional Planar IGBT and to give useful database for devices modeling, design and optimization