• DocumentCode
    3256303
  • Title

    Metric Learning for Music Symbol Recognition

  • Author

    Rebelo, Ana ; Tkaczuk, Jakub ; Sousa, Ricardo ; Cardoso, Jaime S.

  • Author_Institution
    INESC Porto, Univ. Porto, Porto, Portugal
  • Volume
    2
  • fYear
    2011
  • fDate
    18-21 Dec. 2011
  • Firstpage
    106
  • Lastpage
    111
  • Abstract
    Although Optical Music Recognition (OMR) has been the focus of much research for decades, the processing of handwritten musical scores is not yet satisfactory. The efforts made to find robust symbol representations and learning methodologies have not found a similar quality in the learning of the dissimilarity concept. Simple Euclidean distances are often used to measure dissimilarity between different examples. However, such distances do not necessarily yield the best performance. In this paper, we propose to learn the best distance for the k-nearest neighbor (k-NN) classifier. The distance concept will be tuned both for the application domain and the adopted representation for the music symbols. The performance of the method is compared with the support vector machine (SVM) classifier using both real and synthetic music scores. The synthetic database includes four types of deformations inducing variability in the printed musical symbols which exist in handwritten music sheets. The work presented here can open new research paths towards a novel automatic musical symbols recognition module for handwritten scores.
  • Keywords
    database management systems; learning (artificial intelligence); music; support vector machines; SVM classifier; automatic musical symbols recognition module; dissimilarity concept; handwritten music sheets; k-nearest neighbor classifier; metric learning; optical music recognition; printed musical symbols; real music scores; robust symbol representations; support vector machine; synthetic database; synthetic music scores; Feature extraction; Kernel; Machine learning; Measurement; Support vector machines; Training; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Applications and Workshops (ICMLA), 2011 10th International Conference on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4577-2134-2
  • Type

    conf

  • DOI
    10.1109/ICMLA.2011.94
  • Filename
    6147057