DocumentCode
3256443
Title
XML in Automatic Test System
Author
Zhang, Yu ; Wang, Ai-hua ; Liang, Shu-Juan
Author_Institution
Sch. of Inf. & Electron., Beijing Inst. of Technol., Beijing, China
Volume
9
fYear
2010
fDate
16-18 Oct. 2010
Firstpage
4489
Lastpage
4492
Abstract
This paper illustrates the XML characteristics and its good performance in data exchange, mainly introduces its application in Automatic Test System, including data saving and retrieving, data exchange with Matlab and Relational Database.
Keywords
XML; automatic test software; data handling; electronic data interchange; relational databases; Matlab database; XML characteristics; automatic test system; data exchange; data retrieval; data saving; extensible markup language; relational database; Data processing; Instruments; Relational databases; Software; Syntactics; XML; ATS; RDB; XML; data exchange;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Signal Processing (CISP), 2010 3rd International Congress on
Conference_Location
Yantai
Print_ISBN
978-1-4244-6513-2
Type
conf
DOI
10.1109/CISP.2010.5646773
Filename
5646773
Link To Document