DocumentCode :
3256763
Title :
Investigation of different options of pre-applied CSP underfill for mechanical reliability enhancements in mobile phones
Author :
Hannan, Nael ; Kujala, Arni ; Mohan, Vinod ; Morganelli, Paul ; Shah, Jayesh
Author_Institution :
Nokia, Helsinki, Finland
Volume :
1
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
770
Abstract :
This paper explores an alternate process for the application of underfill. The ideal process for an efficient SMT line is to apply the underfill to the package prior to shipping, thus moving all underfill handling and processing steps to the package manufacturer. The process creates a component that can be loaded into tape and reel and handled as any other surface mount part. Standard pick-and-place equipment can then be used to pick the component and place it on the PWB. The underfill cures during reflow, and may be reworkable. This process is called pre-applied chip scale package underfill and must handle the moisture coming off the PWB during reflow to create a near void-free underfill layer, minimizing any potential for solder bridging. The current investigation provides results of a study aimed at enhancing mechanical shock reliability. Reliability results of four different pre-applied underfill options are presented and development and qualification of a pre-applied CSP underfill process is described. Issues surrounding development of effective materials, processes and equipment for reinforcing board-mounted CSPs in a high volume production environment are also discussed in this paper.
Keywords :
assembling; chip scale packaging; curing; encapsulation; impact strength; integrated circuit reliability; mobile handsets; surface mount technology; PWB; SMT; board-mounted CSP; drop testing; high volume production; mechanical reliability enhancement; mechanical shock reliability; mobile phones; pick-and-place equipment; pre-applied CSP underfill; reflow cured underfill; reworkable underfill; solder bridging; void-free layer; Assembly; Chip scale packaging; Electric shock; Electronics packaging; Mobile handsets; Moisture; Packaging machines; Stress; Surface-mount technology; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
Type :
conf
DOI :
10.1109/ECTC.2004.1319424
Filename :
1319424
Link To Document :
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