Title :
Efficient stimuli generators for detection of path delay faults
Author :
Gjermundnes, Oystein ; Aas, Einar J.
Author_Institution :
Dept. of Electron. & Telecommun., NTNU, Trondheim
Abstract :
This paper presents a way to construct accumulator based test vector generators intended for efficient detection of path delay faults. Experiments conducted using our path delay fault simulator, GFault, shows that our proposed generator can give as much as 30times reduction in test time for circuits in the ISCAS85 benchmark suite compared to an accumulator based pseudo random generator
Keywords :
benchmark testing; delays; fault simulation; random number generation; ISCAS85 benchmark suite; accumulator based pseudo random generator; accumulator based test vector generators; path delay fault detection; path delay fault simulator; stimuli generators; Circuit faults; Circuit simulation; Circuit testing; Delay; Electrical fault detection; Electronic equipment testing; Fault detection; Hardware; Robustness; Test pattern generators;
Conference_Titel :
Circuits and Systems, 2005. 48th Midwest Symposium on
Conference_Location :
Covington, KY
Print_ISBN :
0-7803-9197-7
DOI :
10.1109/MWSCAS.2005.1594449
