Implicit cube-distance error modeling for functional testing and simulation

A method of modeling functional errors in terms of cube-distance errors is proposed. To maintain the fault list at manageable lengths, the functional faults are classified by implicit cube-distances. These cube-distance errors not only represent explicit gate replacement errors, but also manufacturing stuck at value (s-a-v) faults, as well as any functional errors. It is shown that only cubes of minimal distances suffice for verification and testing. A method of redundancy identification of the proposed model is also discussed