• DocumentCode
    3257069
  • Title

    Optical and Structural Properties of SnO2-Based Sol-Gel Thin Films

  • Author

    Anastasescu, M. ; Gartner, M. ; Mihaiu, S. ; Anastasescu, C. ; Purica, M. ; Manea, E. ; Zaharescu, M.

  • Author_Institution
    Inst. of Phys. Chem., "Ilie Murgulescu" of the Romanian Acad., Bucharest
  • Volume
    1
  • fYear
    2006
  • fDate
    27-29 Sept. 2006
  • Firstpage
    163
  • Lastpage
    166
  • Abstract
    SnO2 thin films have been deposited on glass from Sn (II)-2-ethylhexanoate precursor using the dip-coating sol-gel method. Based on spectroscopic ellipsometry (SE) measurements optical and structural properties of the SnO2 films have been obtained. It was found that the concentration of tin oxide sols used for deposition strongly influences the thickness and the optical properties of the film, such as optical constants (n and k) or optical conductivity (sigma)
  • Keywords
    dip coating; ellipsometry; glass; optical properties; sol-gel processing; sols; thin films; tin compounds; SE measurements; Sn (II)-2-ethylhexanoate precursor; SnO2; SnO2 thin films; dip-coating sol-gel method; optical properties; sol-gel thin films; spectroscopic ellipsometry measurements; structural properties; tin oxide sols; Conductivity; Dip coating; Glass; Optical films; Optical sensors; Semiconductor films; Sensor arrays; Sputtering; Substrates; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International Semiconductor Conference, 2006
  • Conference_Location
    Sinaia
  • Print_ISBN
    1-4244-0109-7
  • Type

    conf

  • DOI
    10.1109/SMICND.2006.283958
  • Filename
    4063185
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3257069