DocumentCode :
3257323
Title :
Piezoresistive MEMS pressure sensor and packaging for harsh oceanic environment
Author :
Mohan, Ashwin ; Malshe, Ajay P. ; Aravamudhan, Shyam ; Bhansali, S.
Author_Institution :
Arkansas Univ., AR, USA
Volume :
1
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
948
Abstract :
We report a fabrication and packaging approach for a piezoresistive micro electro mechanical (MEMS) pressure sensor designed to operate up to a depth of hundreds of meters under harsh seawater conditions. The pressure values at such depths would typically be in the range of 3000 psi and the temperature conditions would vary from as low as -5°C to 60°C. The sensor essentially consists of an array of silicon diaphragms 20-60 μm in thickness with selective regions diffused with boron (p-type) that act as piezoresistors. The packaging solution involves a wafer-level and chip scale interconnection, approach taking into consideration appropriate material selection for harsh oceanic environments. The packaged pressure sensor is tested in a simulated harsh oceanic environment. Functional tests are performed in a custom-built pressure chamber, where the deep-sea water conditions were simulated (approximately depth of 1000 m). The tests demonstrated excellent mechanical integrity of the packaged device.
Keywords :
boron; chip scale packaging; diaphragms; electronics packaging; elemental semiconductors; interconnections; microsensors; piezoresistive devices; pressure sensors; silicon; -5 to 60 degC; 1000 m; 20 to 60 micron; 3000 psi; Si:B; chip scale interconnection; deep-sea water conditions; diaphragm array; harsh oceanic environment; piezoresistive MEMS pressure sensor; piezoresistors; seawater conditions; sensor packaging; wafer-level interconnection; Fabrication; Mechanical sensors; Micromechanical devices; Ocean temperature; Packaging; Piezoresistance; Sensor arrays; Temperature distribution; Testing; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
Type :
conf
DOI :
10.1109/ECTC.2004.1319452
Filename :
1319452
Link To Document :
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