Title :
Quantitative Model Checking of Continuous-Time Markov Chains Against Timed Automata Specifications
Author :
Chen, Taolue ; Han, Tingting ; Katoen, Joost-Pieter ; Mereacre, Alexandru
Author_Institution :
CWI, Amsterdam, Netherlands
Abstract :
We study the following problem: given a continuous-time Markov chain (CTMC) C, and a linear real-time property provided as a deterministic timed automaton (DTA) A, what is the probability of the set of paths of C that are accepted by A (C satisfies A)? It is shown that this set of paths is measurable and computing its probability can be reduced to computing the reachability probability in a piecewise deterministic Markov process (PDP). The reachability probability is characterized as the least solution of a system of integral equations and is shown to be approximated by solving a system of partial differential equations. For the special case of single-clock DTA, the system of integral equations can be transformed into a system of linear equations where the coefficients are solutions of ordinary differential equations.
Keywords :
Markov processes; computational complexity; continuous time systems; deterministic automata; formal specification; formal verification; integral equations; linear differential equations; partial differential equations; probability; reachability analysis; set theory; temporal logic; CTMC; PDP; continuous stochastic logic; continuous-time Markov chain; deterministic timed automaton specification; integral equation; linear equation; linear real-time property; ordinary differential equation; partial differential equation; path set; piecewise deterministic Markov process; polynomial-time algorithm; quantitative model checking; reachability probability; single-clock DTA; temporal logic CSL; timed CTL; Automata; Biological system modeling; Clocks; Differential equations; Integral equations; Markov processes; Partial differential equations; Probabilistic logic; Stochastic processes; Stochastic systems;
Conference_Titel :
Logic In Computer Science, 2009. LICS '09. 24th Annual IEEE Symposium on
Conference_Location :
Los Angeles, CA
Print_ISBN :
978-0-7695-3746-7
DOI :
10.1109/LICS.2009.21