Exact evaluation of diagnostic test resolution

Author

Kubiak, Ken ; Parkes, Steven ; Fuchs, W. Kent ; Saleh, Resve

Author_Institution

Coord. Sci. Lab., Illinois Univ., Urbana, IL, USA

fYear

1992

fDate

8-12 Jun 1992

Firstpage

347

Lastpage

352

Abstract

The authors introduce a new measure of the diagnostic resolution of a test set: the sizes of all equivalence classes in the circuit under the test set. This measure is a better indicator of the diagnostic capabilities of a test set than single-value metrics based on undistinguished pairs of faults or completely distinguished faults. A symbolic algorithm for computing equivalence class sizes has been used to evaluate the diagnostic resolution of deterministic single-stuck-at fault test sets for ISCAS combinational and sequential benchmark circuits

Keywords

combinatorial circuits; fault location; logic testing; sequential circuits; ISCAS combinational; deterministic single-stuck-at fault test sets; diagnostic capabilities; diagnostic test resolution; equivalence classes; exact evaluation; sequential benchmark circuits; single-value metrics; symbolic algorithm; Benchmark testing; Binary decision diagrams; Boolean functions; Circuit faults; Circuit testing; Coordinate measuring machines; Fault diagnosis; Fault location; Size measurement; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE

Conference_Location

Anaheim, CA

ISSN

0738-100X

Print_ISBN

0-8186-2822-7

Type

conf

DOI

10.1109/DAC.1992.227780

Filename

227780