• DocumentCode
    3257487
  • Title

    HOPE: an efficient parallel fault simulator

  • Author

    Lee, Hyung Ki ; Ha, Dong Sam

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • fYear
    1992
  • fDate
    8-12 Jun 1992
  • Firstpage
    336
  • Lastpage
    340
  • Abstract
    The authors present an efficient sequential circuit parallel fault simulator, HOPE, which simulates 32 faults at a time. HOPE is a parallel fault simulator based on single fault propagation. It adopts the zero gate delay model. The key idea incorporated in HOPE is to screen out faults with short propagation paths, and prevent them from being simulated in parallel. The screening process drastically reduces the number of faults simulated in parallel to achieve substantial speedup. The experimental results presented show that HOPE is about two times faster than PROOFS for most ISCAS89 sequential benchmark circuits
  • Keywords
    delays; fault location; logic testing; sequential circuits; HOPE; PROOFS; parallel fault simulator; screening process; sequential circuit; single fault propagation; zero gate delay model; Automation; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Delay; Fault diagnosis; Gold; Logic; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-2822-7
  • Type

    conf

  • DOI
    10.1109/DAC.1992.227782
  • Filename
    227782