• DocumentCode
    3257608
  • Title

    A dynamic switching activity generation technique for power analysis of electronic circuits

  • Author

    Karunaratne, Maddu ; Ranasinghe, Chamara ; Sagahyroon, Assim

  • Author_Institution
    Pittsburgh Univ., Johnstown, PA
  • fYear
    2005
  • fDate
    7-10 Aug. 2005
  • Firstpage
    1884
  • Abstract
    This paper describes an approach to generation of switching activities in multiclock ASIC designs. The goal is to obtain realistic worst-case power consumption of a design in order to determine die size, power rail, and power supply requirements. The software program developed is named HeatGen whose proprietary algorithms internally generate a discreet collection of switching activity scenarios for the design, and represent them in a global activity file (GAF) as the output. It optionally writes a test bench which lets designers replay those internally simulated scenarios through logic simulations. This approach does not require user-supplied external stimuli, but it creates stimulus by itself based on switching and power data in library cells. Such characterization data consists of how much energy a cell releases due to its internal signal changes, and how external loads and capacitances add to its energy usage. Cell internal power is the most significant component in generating switching activities and is being used by the proposed method in this paper
  • Keywords
    application specific integrated circuits; circuit CAD; integrated circuit design; logic simulation; HeatGen; die size; dynamic switching activity generation; electronic circuits; global activity file; logic simulations; multiclock ASIC designs; power analysis; power rail; power supply requirements; proprietary algorithms; worst-case power consumption; Application specific integrated circuits; Circuit analysis; Electronic circuits; Energy consumption; Logic testing; Power generation; Power supplies; Rails; Software algorithms; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2005. 48th Midwest Symposium on
  • Conference_Location
    Covington, KY
  • Print_ISBN
    0-7803-9197-7
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2005.1594492
  • Filename
    1594492