Title :
Automatic test knowledge extraction from VHDL (ATKET)
Author :
Vishakantaiah, Praveen ; Abraham, Jacob ; Abadir, Magdy
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Abstract :
The authors describe ATKET (automatic test knowledge extraction tool), which synthesizes test knowledge using structural and behavioral information available in the very high-speed IC description language (VHDL) description of a design. A VHDL analyzer produces an intermediate representation of the information contained in a VHDL design. ATKET interfaces to this intermediate representation to access structural and behavioral information in the design and stores it in suitable data structures. A convenient representation called the module operation tree (MOT) is used to capture the behavior of modules in the design. Information stored in the MOT along with structural information describing connections between modules in the design is used to generate test knowledge. Results obtained from ATKET for a circuit which was difficult to test are presented
Keywords :
VLSI; circuit analysis computing; knowledge acquisition; software tools; specification languages; VLSI; automatic test knowledge extraction; behavioral information; data structures; module operation tree; structural information; very high-speed IC description language; Automatic testing; Automation; Circuit faults; Circuit testing; Data mining; Design engineering; Jacobian matrices; Microelectronics; Sequential analysis; Switches;
Conference_Titel :
Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-8186-2822-7
DOI :
10.1109/DAC.1992.227793