• DocumentCode
    3257678
  • Title

    Automatic test knowledge extraction from VHDL (ATKET)

  • Author

    Vishakantaiah, Praveen ; Abraham, Jacob ; Abadir, Magdy

  • Author_Institution
    Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
  • fYear
    1992
  • fDate
    8-12 Jun 1992
  • Firstpage
    273
  • Lastpage
    278
  • Abstract
    The authors describe ATKET (automatic test knowledge extraction tool), which synthesizes test knowledge using structural and behavioral information available in the very high-speed IC description language (VHDL) description of a design. A VHDL analyzer produces an intermediate representation of the information contained in a VHDL design. ATKET interfaces to this intermediate representation to access structural and behavioral information in the design and stores it in suitable data structures. A convenient representation called the module operation tree (MOT) is used to capture the behavior of modules in the design. Information stored in the MOT along with structural information describing connections between modules in the design is used to generate test knowledge. Results obtained from ATKET for a circuit which was difficult to test are presented
  • Keywords
    VLSI; circuit analysis computing; knowledge acquisition; software tools; specification languages; VLSI; automatic test knowledge extraction; behavioral information; data structures; module operation tree; structural information; very high-speed IC description language; Automatic testing; Automation; Circuit faults; Circuit testing; Data mining; Design engineering; Jacobian matrices; Microelectronics; Sequential analysis; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-2822-7
  • Type

    conf

  • DOI
    10.1109/DAC.1992.227793
  • Filename
    227793