DocumentCode
3257678
Title
Automatic test knowledge extraction from VHDL (ATKET)
Author
Vishakantaiah, Praveen ; Abraham, Jacob ; Abadir, Magdy
Author_Institution
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
fYear
1992
fDate
8-12 Jun 1992
Firstpage
273
Lastpage
278
Abstract
The authors describe ATKET (automatic test knowledge extraction tool), which synthesizes test knowledge using structural and behavioral information available in the very high-speed IC description language (VHDL) description of a design. A VHDL analyzer produces an intermediate representation of the information contained in a VHDL design. ATKET interfaces to this intermediate representation to access structural and behavioral information in the design and stores it in suitable data structures. A convenient representation called the module operation tree (MOT) is used to capture the behavior of modules in the design. Information stored in the MOT along with structural information describing connections between modules in the design is used to generate test knowledge. Results obtained from ATKET for a circuit which was difficult to test are presented
Keywords
VLSI; circuit analysis computing; knowledge acquisition; software tools; specification languages; VLSI; automatic test knowledge extraction; behavioral information; data structures; module operation tree; structural information; very high-speed IC description language; Automatic testing; Automation; Circuit faults; Circuit testing; Data mining; Design engineering; Jacobian matrices; Microelectronics; Sequential analysis; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE
Conference_Location
Anaheim, CA
ISSN
0738-100X
Print_ISBN
0-8186-2822-7
Type
conf
DOI
10.1109/DAC.1992.227793
Filename
227793
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